General Purpose Electronic Test Equipment Parts

End item NSN parts page 1 of 45
Part Number
NSN
NIIN
000-8005-048 Electronic Te Function Generator
011078152
000-8005-049 Digital Reado Electronic Counter
011653153
006DA02780 Signal Generator
013824812
010-0177-01 Test Probe
004982232
012-0180-00 Test Lead
010171238
015-0140-03 Test Lead
001726612
0192904W00 Electrical Frequency Meter
009309687
0196027E00 Broad Band Test Set
001133491
025413780 Optical Power Test Set
014811165
05340-90011 Digital Reado Electronic Counter
011225602
05340-90021 Digital Reado Electronic Counter
011225602
067-0532-00 Electrical-electron Plug-in Unit
005315143
067-0587-02 Electrical-electron Test Fixture
010928915
0705-8120 Fiber Optic System Repair Kit
015251214
0801-8000 Fiber Optic System Tool Kit
014160567
0801-8015 Fiber Optic System Tool Kit
015167227
0801-8510 Fiber Optic System Tool Kit
015167227
0806285-0001 Oscilloscope
004713015
0A-2090B-SA1194 Noise Test Set
011543664
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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