Αριθμός ανταλλακτικού
Αποστρατιωτικοποίηση
Διάρκεια ζωής
UOM
NIIN
Αριθμός ανταλλακτικού:
1249
NSN
Εθνικός αριθμός αποθέματος:
TXT
Περιγραφή:
Semiconductor Device Test Set
Κωδικός ονόματος στοιχείου:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
11.200 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 117.0 volts and 234.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
12.200 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Evaluate digital integrated circuits
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Data setup time 230/800 ns; clockpulse width 140/440 ns; output settling time 630/2760 ns
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
5.900 inches
