General Purpose Electronic Test Equipment Parts

(Page 7) End item NSN parts page 7 of 45
Part Number
NSN
NIIN
1404-B Fixed Capacitance Standard
010086149
14061298-7 Digital Reado Electronic Counter
010491844
140A Oscilloscope
009570509
1412-9410 Decade Capacitor
013635830
1413 Decade Capacitor
012493361
141A Oscilloscope
000640187
141T Electrical Pulse Analyzer
004244370
141T-908-900 Electrical Pulse Analyzer
004244370
142 Signal Generator
002023585
1425A Sampling Time Base
002539171
1432-9716 Decade Resistor
005853152
1432P Decade Resistor
005853152
1432X Decade Resistor
009477534
1433-22 Decade Resistor
009477534
1433-28 Decade Resistor
001408183
1433-9715 Decade Resistor
004634011
1433-9716 Decade Resistor
002289918
1433-9720 Decade Resistor
001029646
1433-9722 Decade Resistor
009477534
1433-9724 Decade Resistor
000313521
Page: 7 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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